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arXiv · 1610.02051

Looking inside three-dimensional (3D) silicon photonic band gap crystals

W. L. Vos·D. A. Grishina·P. Cloetens·C. A. M. Harteveld·P. W. H. Pinkse
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Abstract

We have performed an x-ray holotomography study of a three-dimensional (3D) photonic band gap crystal. The crystals was made from silicon by CMOS-compatible methods. We manage to obtain the 3D material density throughout the fabricated crystal. We observe that the structural design is for most aspects well-realized by the fabricated nanostructure. One peculiar feature is a slight shear-distortion of the cubic crystal structure. We conclude that 3D X-ray tomography has great potential to solve many future questions on optical metamaterials.

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W. L. Vos, D. A. Grishina, P. Cloetens, C. A. M. Harteveld, P. W. H. Pinkse. 2016-09-08. Looking inside three-dimensional (3D) silicon photonic band gap crystals. https://arxiv.org/abs/1610.02051

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