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arXiv · 1610.05100

Modified Bohm's theory for abstruse measurements: application to layer depth profiling by Auger spectroscopy

Edward Rówiński·Mariusz Pietruszka
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Abstract

Modified Bohm formalism is applied to solve a problem of abstruse layer depth profiles measured by the Auger electron spectroscopy technique in real physical systems, i.e., the desorbed carbon/passive layer on NiTi substrate and the adsorbed oxygen/surface of NiTi alloy. It is shown that abstruse layer profiles may be converted to real layer structures using the modified Bohm theory, where the quantum potential is due to an Auger electron effect. It is also pointed out that the stationary probability density predicts multilayer structures of abstruse depth profiles caused by carbon desorption and oxygen adsorption processes. The criterion for a kind of break between the physical and unphysical multilayer systems was found. We have concluded that the physics is also characterized by the abstruse measurement and the modified Bohm formalism

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Edward Rówiński, Mariusz Pietruszka. 2016-10-17. Modified Bohm's theory for abstruse measurements: application to layer depth profiling by Auger spectroscopy. https://doi.org/10.24425/amm.2019.126234

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