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arXiv · 1701.04638

Background force compensation in dynamic atomic force microscopy

Riccardo Borgani·Per-Anders Thorén·Daniel Forchheimer·Illia Dobryden·Si Mohamed Sah·Per Martin Claesson·David B. Haviland
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Abstract

Background forces are linear long-range interactions of the cantilever body with its surroundings that must be compensated for in order to reveal tip-surface force, the quantity of interest for determining material properties in atomic force microscopy. We provide a mathematical derivation of a method to compensate for background forces, apply it to experimental data, and discuss how to include background forces in simulation. Our method, based on linear-response theory in the frequency domain, provides a general way of measuring and compensating for any background force and it can be readily applied to different force reconstruction methods in dynamic AFM.

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Riccardo Borgani, Per-Anders Thorén, Daniel Forchheimer, Illia Dobryden, Si Mohamed Sah, Per Martin Claesson, David B. Haviland. 2017-01-17. Background force compensation in dynamic atomic force microscopy. https://doi.org/10.1103/physrevapplied.7.064018

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