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arXiv · 1807.00424

Oscillating magnetic field effects in high precision metrology

H. C. J. Gan·G. Maslennikov·K. W. Tseng·T. R. Tan·R. Kaewuam·K. J. Arnold·D. Matsukevich·M. D. Barrett
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Abstract

We examine a range of effects arising from ac magnetic fields in high precision metrology. These results are directly relevant to high precision measurements, and accuracy assessments for state-of-the-art optical clocks. Strategies to characterize these effects are discussed and a simple technique to accurately determine trap-induced ac magnetic fields in a linear Paul trap is demonstrated using $^{171}\mathrm{Yb}^+$

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H. C. J. Gan, G. Maslennikov, K. W. Tseng, T. R. Tan, R. Kaewuam, K. J. Arnold, D. Matsukevich, M. D. Barrett. 2018-07-02. Oscillating magnetic field effects in high precision metrology. https://doi.org/10.1103/physreva.98.032514

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