Observation of the angular distribution of a x-ray characteristic emission through a periodic multilayer

Philippe Jonnard; Meiyi Wu; Jean-Michel André; Karine Le Guen; Zhanshan Wang; Qiushi Huang; Ian Vickridge; Didier Schmaus; Emrick Briand; Sébastien Steydli; Philippe Walter

doi:10.1063/1.5040980

arXiv · 1809.10989

Observation of the angular distribution of a x-ray characteristic emission through a periodic multilayer

Philippe Jonnard·Meiyi Wu·Jean-Michel André·Karine Le Guen·Zhanshan Wang·Qiushi Huang·Ian Vickridge·Didier Schmaus·Emrick Briand·Sébastien Steydli·Philippe Walter

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Abstract

We present the observation of the angular distribution of a characteristic x-ray emission through a periodic multilayer. The emission coming from the substrate on which the multilayer is deposited is used for this purpose. It is generated upon proton irradiation through the multilayer and detected with an energy sensitive CCD camera. The observed distribution in the low detection angle range presents a clear dip at a position characteristic of the emitting element. Thus, such a device can be envisaged as a spectrometer without mechanical displacement and using various ionizing sources (electrons, x-rays, ions), their incident direction being irrelevant.

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Philippe Jonnard, Meiyi Wu, Jean-Michel André, Karine Le Guen, Zhanshan Wang, Qiushi Huang, Ian Vickridge, Didier Schmaus, Emrick Briand, Sébastien Steydli, Philippe Walter. 2018-09-28. Observation of the angular distribution of a x-ray characteristic emission through a periodic multilayer. https://doi.org/10.1063/1.5040980

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