Fluxon-induced losses in niobium thin-film cavities revisited

Wolfgang Weingarten

doi:10.1109/tasc.2020.2998941

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arXiv · 1904.07160

Fluxon-induced losses in niobium thin-film cavities revisited

Wolfgang Weingarten

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Abstract

Long standing data from niobium thin film accelerating cavities will be revisited and analysed by a modified London model of RF superconductivity. Firstly, the applicability of this model is explored using data of the BCS surface resistance and its dependence on the RF magnetic field, temperature and mean free path. Secondly, the RF losses from trapped magnetic flux are analysed with regard to their dependence on these same parameters.

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Wolfgang Weingarten. 2019-04-15. Fluxon-induced losses in niobium thin-film cavities revisited. https://doi.org/10.1109/tasc.2020.2998941

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