Characterising Quantum Devices at Scale with Custom Cryo-CMOS

S. J. Pauka; K. Das; J. M. Hornibrook; G. C. Gardner; M. J. Manfra; M. C. Cassidy; D. J. Reilly

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arXiv · 1908.07685

Characterising Quantum Devices at Scale with Custom Cryo-CMOS

S. J. Pauka·K. Das·J. M. Hornibrook·G. C. Gardner·M. J. Manfra·M. C. Cassidy·D. J. Reilly

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Abstract

We make use of a custom-designed cryo-CMOS multiplexer (MUX) to enable multiple quantum devices to be characterized in a single cool-down of a dilution refrigerator. Combined with a packaging approach that integrates cryo-CMOS chips and a hot-swappable, parallel device test platform, we describe how this setup takes a standard wiring configuration as input and expands the capability for batch-characterization of quantum devices at milli-Kelvin temperatures and high magnetic fields. The architecture of the cryo-CMOS multiplexer is discussed and performance benchmarked using few-electron quantum dots and Hall mobility-mapping measurements.

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S. J. Pauka, K. Das, J. M. Hornibrook, G. C. Gardner, M. J. Manfra, M. C. Cassidy, D. J. Reilly. 2019-08-21. Characterising Quantum Devices at Scale with Custom Cryo-CMOS. https://arxiv.org/abs/1908.07685

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