Interlayer band-to-band tunneling and negative differential resistance in van der Waals BP/InSe field effect transistors

Quanshan Lv; Faguang Yan; Nobuya Mori; Wenkai Zhu; Ce Hu; Zakhar R. Kudrynskyi; Zakhar D. Kovalyuk; Amalia Patanè; Kaiyou Wang

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arXiv · 2001.10273

Interlayer band-to-band tunneling and negative differential resistance in van der Waals BP/InSe field effect transistors

Quanshan Lv·Faguang Yan·Nobuya Mori·Wenkai Zhu·Ce Hu·Zakhar R. Kudrynskyi·Zakhar D. Kovalyuk·Amalia Patanè·Kaiyou Wang

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Abstract

Atomically thin layers of van der Waals (vdW) crystals offer an ideal material platform to realize tunnel field effect transistors (TFETs) that exploit the tunneling of charge carriers across the forbidden gap of a vdW heterojunction. This type of device requires a precise energy band alignment of the different layers of the junction to optimize the tunnel current. Amongst two-dimensional (2D) vdW materials, black phosphorus (BP) and indium selenide (InSe) have a Brillouin zone-centered conduction and valence bands, and a type II band offset, both ideally suited for band-to-band tunneling. Here, we demonstrate TFETs based on BP/InSe heterojunctions with diverse electrical transport characteristics: forward rectifying, Zener-tunneling and backward rectifying characteristics are realized in BP/InSe junctions with different thickness of the BP layer or by electrostatic gating of the junction. Electrostatic gating yields a large on/off current ratio of up to 108 and negative differential resistance at low applied voltages (V ~ 0.2V). These findings illustrate versatile functionalities of TFETs based on BP and InSe, offering opportunities for applications of these 2D materials beyond the device architectures reported in the current literature.

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Quanshan Lv, Faguang Yan, Nobuya Mori, Wenkai Zhu, Ce Hu, Zakhar R. Kudrynskyi, Zakhar D. Kovalyuk, Amalia Patanè, Kaiyou Wang. 2020-01-28. Interlayer band-to-band tunneling and negative differential resistance in van der Waals BP/InSe field effect transistors. https://arxiv.org/abs/2001.10273

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