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arXiv · 2101.09248

Semiconductors and Dirichlet-to-Neumann maps

A. Leitao
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Abstract

We investigate the problem of identifying discontinuous doping profiles in semiconductor devices from data obtained by the stationary voltage-current (VC) map. The related inverse problem correspond to the inverse problem for the Dirichlet-to-Neumann (DN) map with partial data.

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A. Leitao. 2021-01-22. Semiconductors and Dirichlet-to-Neumann maps. https://doi.org/10.1590/s0101-82052006000200005

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