X-ray diffraction with micrometer spatial resolution for highly absorbing samples

P. Chakrabarti; A. Wildeis; M. Hartmann; R. Brandt; R. Döhrmann; G. Fevola; C. Ossig; M. E. Stuckelberger; J. Garrevoet; K. V. Falch; V. Galbierz; G. Falkenberg; P. Modregger

arXiv · 2201.13264

X-ray diffraction with micrometer spatial resolution for highly absorbing samples

P. Chakrabarti·A. Wildeis·M. Hartmann·R. Brandt·R. Döhrmann·G. Fevola·C. Ossig·M. E. Stuckelberger·J. Garrevoet·K. V. Falch·V. Galbierz·G. Falkenberg·P. Modregger

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Abstract

X-ray diffraction with high spatial resolution is commonly used to characterize (poly-)crystalline samples with, for example, respect to local strain, residual stress, grain boundaries and texture. However, the investigation of highly absorbing samples or the simultaneous assessment of high-Z materials by X-ray fluorescence have been limited due to the utilisation of low photon energies. Here, we report on a goniometer-based setup implemented at the P06 beamline of PETRA III that allows for micrometer spatial resolution with a photon energy of 35 keV and above. A highly focused beam was achieved by using compound refractive lenses and high precision sample manipulation was enabled by a goniometer that allows for up to 5D scans (3 rotations & 2 translations). As experimental examples, we demonstrate the determination of local strain variations in martensitic steel samples with micrometer spatial resolution as well as the simultaneous elemental distribution for high-Z materials in a thin film solar cell. Our proposed approach allows users from the materials science community to determine micro-structural properties even in highly absorbing samples.

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P. Chakrabarti, A. Wildeis, M. Hartmann, R. Brandt, R. Döhrmann, G. Fevola, C. Ossig, M. E. Stuckelberger, J. Garrevoet, K. V. Falch, V. Galbierz, G. Falkenberg, P. Modregger. 2022-01-31. X-ray diffraction with micrometer spatial resolution for highly absorbing samples. https://arxiv.org/abs/2201.13264

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