Advanced technique for measuring relative length changes under control of temperature and helium-gas pressure

Abstract

We report the realization of an advanced technique for measuring relative length changes $\Delta L/L$ of mm-sized samples under control of temperature ($T$) and helium-gas pressure ($P$). The system, which is an extension of the apparatus described in Manna et al., Rev. Sci. Instrum. 83, 085111 (2012), consists of two $^4$He-bath cryostats each of which houses a pressure cell and a capacitive dilatometer. The interconnection of the pressure cells, the temperature of which can be controlled individually, opens up various modes of operation to perform measurements of $\Delta L/L$ under variation of temperature and pressure. Special features of this apparatus include the possibilities (1) to increase the pressure to values much in excess of the external pressure reservoir, (2) to substantially improve the pressure stability during temperature sweeps, (3) to enable continuous pressure sweeps both with decreasing and increasing pressure, and (4) to simultaneously measure the dielectric constant of the pressure-transmitting medium helium, $\varepsilon_{\mathrm{r}}^{\mathrm{He}}(T,P)$, along the same $T$-$P$ trajectory as used for taking the $\Delta L(T,P)/L$ data. The performance of the setup is demonstrated by measurements of relative length changes $(\Delta L/L)_T$ at $T=180\,\mathrm{K}$ of single crystalline NaCl upon continuously varying the pressure in the range $6\,\mathrm{MPa}\leq P \leq 40\,\mathrm{MPa}$.