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arXiv · 2303.15312

Voltage scanning and technical upgrades at the Collinear Resonance Ionization Spectroscopy experiment

Michail Athanasakis-Kaklamanakis·Jordan R. Reilly·Agota Koszorus·Shane G. Wilkins·Louis Lalanne·Sarina Geldhof·Miranda Nichols·Quanjun Wang·Bram van den Borne·David Chorlton·Thomas E. Cocolios·Kieran T. Flanagan·Ronald F. Garcia Ruiz·Ruben de Groote·Dag Hanstorp·Gerda Neyens·Andrew J. Smith·Adam R. Vernon·Xiaofei F. Yang
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Abstract

To optimize the performance of the Collinear Resonance Ionization Spectroscopy (CRIS) experiment at CERN-ISOLDE, technical upgrades are continuously introduced, aiming to enhance its sensitivity, precision, stability, and efficiency. Recently, a voltage-scanning setup was developed and commissioned at CRIS, which improved the scanning speed by a factor of three as compared to the current laser-frequency scanning approach. This leads to faster measurements of the hyperfine structure for systems with high yields (more than a few thousand ions per second). Additionally, several beamline sections have been redesigned and manufactured, including a new field-ionization unit, a sharper electrostatic bend, and improved ion optics. The beamline upgrades are expected to yield an improvement of at least a factor of 5 in the signal-to-noise ratio by suppressing the non-resonant laser ions and providing time-of-flight separation between the resonant ions and the collisional background. Overall, the presented developments will further improve the selectivity, sensitivity, and efficiency of the CRIS technique.

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Michail Athanasakis-Kaklamanakis, Jordan R. Reilly, Agota Koszorus, Shane G. Wilkins, Louis Lalanne, Sarina Geldhof, Miranda Nichols, Quanjun Wang, Bram van den Borne, David Chorlton, Thomas E. Cocolios, Kieran T. Flanagan, Ronald F. Garcia Ruiz, Ruben de Groote, Dag Hanstorp, Gerda Neyens, Andrew J. Smith, Adam R. Vernon, Xiaofei F. Yang. 2023-03-20. Voltage scanning and technical upgrades at the Collinear Resonance Ionization Spectroscopy experiment. https://doi.org/10.1016/j.nimb.2023.04.054

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