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arXiv · 2307.14582

Resistive Switching Conducting Filament Electroformation with an Electrothermal Phase Field Method

John F. Sevic·Nobuhiko P. Kobayashi
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Abstract

A phase field method self-consistently coupled to continuum heat transport and charge conservation is used to simulate conducting filament dynamical evolution and nanostructure of electroformed resistive switching thin films. Our method does not require a pre-defined idealized conducting filament, as previous methods do, instead treating its dynamical evolution as a stochastic diffuse interface problem subject to a variational principle. Our simulation results agree well with available experimental observations, correctly reproducing electroformed conducting filament nanostructure exhibited by a variety of resistive switching thin films.

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John F. Sevic, Nobuhiko P. Kobayashi. 2023-07-27. Resistive Switching Conducting Filament Electroformation with an Electrothermal Phase Field Method. https://arxiv.org/abs/2307.14582

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