Epitaxial growth and characterization of multi-layer site-controlled InGaAs quantum dots based on the buried stressor method

Imad Limame; Ching-Wen Shih; Alexej Koltchanov; Fabian Heisinger; Felix Nippert; Moritz Plattner; Johannes Schall; Markus R. Wagner; Sven Rodt; Petr Klenovsky; Stephan Reitzenstein

arXiv · 2311.05777

Epitaxial growth and characterization of multi-layer site-controlled InGaAs quantum dots based on the buried stressor method

Imad Limame·Ching-Wen Shih·Alexej Koltchanov·Fabian Heisinger·Felix Nippert·Moritz Plattner·Johannes Schall·Markus R. Wagner·Sven Rodt·Petr Klenovsky·Stephan Reitzenstein

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Abstract

We report on the epitaxial growth, theoretical modeling, and structural as well as optical investigation of multi-layer, site-controlled quantum dots fabricated using the buried stressor method. This advanced growth technique utilizes the strain from a partially oxidized AlAs layer to induce site-selective nucleation of InGaAs quantum dots. By implementing strain-induced spectral nano-engineering, we achieve separation in emission energy by about 150 meV of positioned and non-positioned quantum dots and a local increase of the emitter density in a single layer. Furthermore, we achieve a threefold increase of the optical intensity and reduce the inhomogeneous broadening of the ensemble emission by 20% via stacking three layers of site-controlled emitters, which is particularly valuable for using the SCQDs in microlaser applications. Moreover, we obtain direct control over emission properties by adjusting the growth and fabrication parameters. Our optimization of site-controlled growth of quantum dots enables the development of photonic devices with enhanced light-matter interaction and microlasers with increased confinement factor and spontaneous emission coupling efficiency.

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Imad Limame, Ching-Wen Shih, Alexej Koltchanov, Fabian Heisinger, Felix Nippert, Moritz Plattner, Johannes Schall, Markus R. Wagner, Sven Rodt, Petr Klenovsky, Stephan Reitzenstein. 2023-11-09. Epitaxial growth and characterization of multi-layer site-controlled InGaAs quantum dots based on the buried stressor method. https://arxiv.org/abs/2311.05777

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