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arXiv · 2403.11458

Pulsed loading of a magneto-optical trap on atom chip for fast pressure recovery in ultrahigh vacuum environment

Vivek Singh·V. B. Tiwari·A. Chaudhary·S. Sarkar·S. R. Mishra
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Abstract

This study presents investigations on pulsed loading of a magneto-optical trap (MOT) on an atom chip in an UHV environment. Using three parallel resistively heated Rb-metal dispensers activated by pulsed current supply, approximately 3.0 $\times$ $10^{7}$ cold $^{87}Rb$ atoms were loaded into the MOT. A current pulse of $\sim$ 24 A with duration of $\sim$ 10 s raised the pressure in the chamber from 2.0 $\times$ $10^{-10}$ Torr to 3.3 $\times$ $10^{-10}$ Torr. Remarkably, the pressure recovery time after switching off the dispensers current was found to be $\sim$ 600 ms, making a significant advancement in achieving fast recovery of UHV environment surrounding the MOT region. This study is very useful for laser cooling and magnetic trapping / evaporative cooling of atoms on atom chip in the same UHV chamber.

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Vivek Singh, V. B. Tiwari, A. Chaudhary, S. Sarkar, S. R. Mishra. 2024-03-18. Pulsed loading of a magneto-optical trap on atom chip for fast pressure recovery in ultrahigh vacuum environment. https://arxiv.org/abs/2403.11458

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