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arXiv · 2406.07171

Enhancing Membrane-Based Scanning Force Microscopy Through an Optical Cavity

Thomas Gisler·David Hälg·Vincent Dumont·Shobhna Misra·Letizia Catalini·Eric C. Langman·Albert Schliesser·Christian L. Degen·Alexander Eichler
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Abstract

The new generation of strained silicon nitride resonators harbors great promise for scanning force microscopy, especially when combined with the extensive toolbox of cavity optomechanics. However, accessing a mechanical resonator inside an optical cavity with a scanning tip is challenging. Here, we experimentally demonstrate a cavity-based scanning force microscope based on a silicon nitride membrane sensor. We overcome geometric constraints by making use of the extended nature of the mechanical resonator normal modes, which allows us to spatially separate the scanning and readout sites of the membrane. Our microscope is geared towards low-temperature applications in the zeptonewton regime, such as nanoscale nuclear spin detection and imaging.

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Thomas Gisler, David Hälg, Vincent Dumont, Shobhna Misra, Letizia Catalini, Eric C. Langman, Albert Schliesser, Christian L. Degen, Alexander Eichler. 2024-06-11. Enhancing Membrane-Based Scanning Force Microscopy Through an Optical Cavity. https://doi.org/10.1103/physrevapplied.22.044001

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