Statistical study and parallelisation of multiplexed single-electron sources

S. Norimoto; P. See; N. Schoinas; I. Rungger; T. O. Boykin II; M. D. Stewart Jr; J. P. Griffiths; C. Chen; D. A. Ritchie; M. Kataoka

arXiv · 2407.05926

Statistical study and parallelisation of multiplexed single-electron sources

S. Norimoto·P. See·N. Schoinas·I. Rungger·T. O. Boykin II·M. D. Stewart Jr·J. P. Griffiths·C. Chen·D. A. Ritchie·M. Kataoka

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Abstract

Increasing electric current from a single-electron source is a main challenge in an effort to establish the standard of the ampere defined by the fixed value of the elementary charge $e$ and operation frequency $f$. While the current scales with $f$, due to an operation frequency limit for maintaining accurate single-electron transfer, parallelisation of singleelectron sources is expected to be a more practical solution to increase the generated electric current $I = Nef$, where $N$ is a number of parallelised devices. One way to parallelise single-electron sources without increasing the complexity in device operation is to use a common gate. Such a scheme will require each device to have the same operation parameters for single-electron transfer. In order to investigate this possibility, we study the statistics for operation gate voltages using single-electron sources embedded in a multiplexer circuit. The multiplexer circuit allows us to measure 64 single-electron sources individually in a single cooldown. We also demonstrate the parallelisation of three single-electron sources and observe the generated current enhanced by a factor of three.

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S. Norimoto, P. See, N. Schoinas, I. Rungger, T. O. Boykin II, M. D. Stewart Jr, J. P. Griffiths, C. Chen, D. A. Ritchie, M. Kataoka. 2024-07-08. Statistical study and parallelisation of multiplexed single-electron sources. https://arxiv.org/abs/2407.05926

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