arXiv · 2502.14462
Single-image Reflectance and Transmittance Estimation from Any Flatbed Scanner
Abstract
Flatbed scanners have emerged as promising devices for high-resolution, single-image material capture. However, existing approaches assume very specific conditions, such as uniform diffuse illumination, which are only available in certain high-end devices, hindering their scalability and cost. In contrast, in this work, we introduce a method inspired by intrinsic image decomposition, which accurately removes both shading and specularity, effectively allowing captures with any flatbed scanner. Further, we extend previous work on single-image material reflectance capture with the estimation of opacity and transmittance, critical components of full material appearance (SVBSDF), improving the results for any material captured with a flatbed scanner, at a very high resolution and accuracy
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Carlos Rodriguez-Pardo, David Pascual-Hernandez, Javier Rodriguez-Vazquez, Jorge Lopez-Moreno, Elena Garces. 2025-02-20. Single-image Reflectance and Transmittance Estimation from Any Flatbed Scanner. https://arxiv.org/abs/2502.14462
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