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arXiv · 2504.07980

Unraveling the dynamics of conductive filaments in MoS${_2}$ based memristors by operando transmission electron microscopy

Ke Ran·Janghyun Jo·Sofía Cruces·Zhenxing Wang·Rafal E. Dunin-Borkowski·Joachim Mayer·Max C. Lemme
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Abstract

Advanced operando transmission electron microscopy (TEM) techniques enable the observation of nanoscale phenomena in electrical devices during operation. They can be used to study the switching mechanisms in two-dimensional (2D) materials-based memristive devices, which is crucial to tailor their operating regimes and improve reliability and variability. Here, we investigate lateral memristive devices composed of 2D layered molybdenum disulfide (MoS${_2}$) with palladium (Pd) and silver (Ag) electrodes. We visualized the formation and migration of Ag conductive filaments (CFs) between the two electrodes under external bias voltage and their complete dissolution upon reversing the bias voltage polarity. The CFs exhibited a wide range of sizes, ranging from several {\AA}ngstr\"oms to tens of nanometers, and followed diverse pathways: along the MoS${_2}$ surfaces, within the van der Waals gap between MoS${_2}$ layers, and through the spacing between MoS${_2}$ bundles. Notably, the Ag electrode functioned as a reservoir for the CFs, as evidenced by the shrinking and growing of the Ag electrode upon switching. Our method enabled correlating the current-voltage responses with real-time TEM imaging, offering insights into failed and anomalous switching behavior, and providing clarity on the cycle-to-cycle variabilities. Our findings provide solid evidence for the electrochemical metallization mechanism, elucidate the formation dynamics of CFs, and reveal key parameters influencing the switching performance. Our approach can be extended to investigate similar memristive devices.

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Ke Ran, Janghyun Jo, Sofía Cruces, Zhenxing Wang, Rafal E. Dunin-Borkowski, Joachim Mayer, Max C. Lemme. 2025-04-03. Unraveling the dynamics of conductive filaments in MoS${_2}$ based memristors by operando transmission electron microscopy. https://doi.org/10.1038/s41467-025-62592-2

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