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arXiv · 2504.17559

Concentration inequalities and cut-off phenomena for penalized model selection within a basic Rademacher framework

Pascal Massart·Vincent Rivoirard
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Abstract

This article exists first and foremost to contribute to a tribute to Patrick Cattiaux. One of the two authors has known Patrick Cattiaux for a very long time, and owes him a great deal. If we are to illustrate the adage that life is made up of chance, then what could be better than the meeting of two young people in the 80s, both of whom fell in love with the mathematics of randomness, and one of whom changed the other's life by letting him in on a secret: if you really believe in it, you can turn this passion into a profession. By another happy coincidence, this tribute comes at just the right time, as Michel Talagrand has been awarded the Abel prize. The temptation was therefore great to do a double. Following one of the many galleries opened up by mathematics, we shall first draw a link between the mathematics of Patrick Cattiaux and that of Michel Talagrand. Then we shall show how the abstract probabilistic material on the concentration of product measures thus revisited can be used to shed light on cut-off phenomena in our field of expertise, mathematical statistics. Nothing revolutionary here, as everyone knows the impact that Talagrand's work has had on the development of mathematical statistics since the late 90s, but we've chosen a very simple framework in which everything can be explained with minimal technicality, leaving the main ideas to the fore.

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Pascal Massart, Vincent Rivoirard. 2025-04-24. Concentration inequalities and cut-off phenomena for penalized model selection within a basic Rademacher framework. https://arxiv.org/abs/2504.17559

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