Thermally Induced Refractive Index Trimming of Visible-Light Silicon Nitride Waveguides Using Suspended Heaters

Abstract

We demonstrate refractive index trimming of visible-light silicon nitride (SiN) waveguides using suspended heater structures. The thermal isolation of the suspended heaters enabled a semi-uniform temperature distribution with estimated temperatures of $\sim$350{\deg}C in the waveguides without reaching potentially damaging temperatures in the titanium nitride resistive heaters. The thermal isolation also enabled trimming temperatures to be reached with a moderate power dissipation of 30 to 40 mW. At a wavelength of 561 nm, modal effective index changes up to $-8.3 \times 10^{-3}$ were observed following thermal trimming, and the index changes were stable over an observation period of 97 days. The devices were fabricated as part of our visible-light integrated photonics platform on 200-mm diameter silicon wafers. The suspended heaters also functioned as efficient thermo-optic phase shifters with power dissipation for a $\pi$ phase shift of about $1.2-1.8$ mW. The trimming method was applied to set the bias points of thermo-optic Mach-Zehnder interferometer switches to reduce the bias power of five devices from $0.29-2.32$ mW to $0.1-0.16$ mW. Thermal trimming at a wavelength of 445 nm was also demonstrated. Through material analysis before and after thermal treatment, we hypothesize that index trimming of the silica (SiO$_2$) waveguide cladding may be a potential underlying mechanism. Additionally, via extrapolations of the measured trimming data, we estimate the thermal aging behavior of the SiN waveguides in the suspended heaters at lower (125 - 250{\deg}C) operating temperatures.