arXiv · 2506.01175
Phase-Matching-Free Sensing with Undetected Light Using a Nonlinear Thin-Film Metasurface
Abstract
In this article, we report classical sensing with undetected light at a wavelength of 1500 nm, detected on a silicon camera at 580 nm, using four-wave mixing from a plasmonic metasurface. The bidirectional nonlinear scattering due to inherent reflections from such thin nonlinear materials modifies their operation within a nonlinear interferometer. The theoretical model for visibility accounting for such bidirectionality as well as pulsed illumination accurately predicts visibility in the system as a function of transmission in the near-infrared seed (idler) arm. Spectrally resolving the visible signal emission evaluates the total dispersion within the interferometer, highlighting the prospect of ultrafast sensing with undetected photons.
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Toby Severs Millard, Nathan Gemmell, Ross C. Schofield, Mohsen Rahmani, Alex S. Clark, Chris C. Phillips, Rupert F. Oulton. 2025-06-01. Phase-Matching-Free Sensing with Undetected Light Using a Nonlinear Thin-Film Metasurface. https://arxiv.org/abs/2506.01175
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