arXiv · 2511.18311
Possibilities of the X-ray Diffraction Data Processing Method for Detecting Reflections with Intensity Below the Background Noise Component
Abstract
The values of the signal-to-noise ratio are determined, at which the method of processing X-ray diffraction data reveals reflections with intensity less than the noise component of the background. The possibilities of the method are demonstrated on weak reflections of $\alpha$-quartz. The method of processing X-ray diffraction data makes it possible to increase the possibilities of X-ray phase analysis in determining the qualitative phase composition of multiphase materials with a small (down to $0.1$ wt. \%) content of several (up to eight) phases.
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S. V. Gabielkov, I. V. Zhyganiuk, A. D. Skorbun, V. G. Kudlai, B. S. Savchenko, P. E. Parkhomchuk, S. O. Chikolovets. 2025-11-23. Possibilities of the X-ray Diffraction Data Processing Method for Detecting Reflections with Intensity Below the Background Noise Component. https://doi.org/10.1017/s0885715624000241
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