Electron Emission Yield Datasets Under Electron Impact From Surfaces Characterized In Situ by XPS or AES

M. Belhaj; S. dadouch

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arXiv · 2512.08693

Electron Emission Yield Datasets Under Electron Impact From Surfaces Characterized In Situ by XPS or AES

M. Belhaj·S. dadouch

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Abstract

We present the measurement, characterization, and calibration procedures used to produce a series of datasets for various conductive and semiconductive materials. The data, provided, include emission yields as a function of incident electron energy together with surface composition obtained from X-Ray Photoelectron Spectroscopy or Auger Electron Spectroscopy analyses. Initial datasets cover copper and gold, with additional materials to be released on arXiv.

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M. Belhaj, S. dadouch. 2025-12-09. Electron Emission Yield Datasets Under Electron Impact From Surfaces Characterized In Situ by XPS or AES. https://arxiv.org/abs/2512.08693

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