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M. Belhaj

Publications and source records attributed to M. Belhaj.

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Electron Emission Yield Datasets Under Electron Impact From Surfaces Characterized In Situ by XPS or AES

We present the measurement, characterization, and calibration procedures used to produce a series of datasets for various conductive and semiconductive materials. The data, provided, include emission yields as a function of incident electron energy together with surface composition obtained from X-Ray Photoelectron Spectroscopy or Auger Electron Spectroscopy analyses. Initial datasets cover copper and gold, with additional materials to be released on arXiv.

physics.app-ph

Electron emission at very low electron impact energy: experimental and Monte-Carlo results

The behaviour of electron emission under electron impact at very low energy is of great importance in many applications such as high energy physics, satellites, nuclear reactors, etc. However the question of the total electron reflectivity is still in discussion. Our experimental and theoretical studies show that the total reflectivity at very low energy is far from being an obvious fact. Moreover, our results show that the yield is close to zero and not equal to one for low energy incident electron.

physics.acc-ph