Universality of Measurement-Induced Criticality under Symmetry-Breaking Measurements

Abstract

We study the critical properties of random quantum circuits with a $U(1)$ symmetry subject to local projective measurements that explicitly break this symmetry. We find that, at the measurement-induced phase transition, symmetry-breaking measurements act as a relevant perturbation at large scales, leading to the same universal critical properties as the corresponding monitored random circuit with non-symmetric unitary dynamics. In particular, we consider monitored $U(1)$-symmetric Haar-random circuits in the limit of large local Hilbert-space dimension, where the trajectory-averaged entanglement entropy can be exactly obtained in terms of a classical statistical mechanics model. In this model, the charge associated with the conservation law follows a symmetric simple exclusion process, in which symmetry-breaking measurements correspond to disordered defects that create and destroy charges. We prove that the charge correlation length remains finite for any measurement rate, ruling out a charge-sharpening transition, in contrast to the case of symmetry-preserving measurements. We further support our predictions at finite local Hilbert-space dimension through numerical finite-size scaling analyses of the entanglement transition in monitored $U(1)$-symmetric Haar and stabilizer random circuits.