Double-dot charge transport in Si single electron/hole transistors

L. P. Rokhinson; L. J. Guo; S. Y. Chou; D. C. Tsui

doi:10.1063/1.126105

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Double-dot charge transport in Si single electron/hole transistors

L. P. Rokhinson·L. J. Guo·S. Y. Chou·D. C. Tsui

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Abstract

We studied transport through ultra-small Si quantum dot transistors fabricated from silicon-on-insulator wafers. At high temperatures, 4K<T<100K, the devices show single-electron or single-hole transport through the lithographically defined dot. At T<4K, current through the devices is characterized by multidot transport. From the analysis of the transport in samples with double-dot characteristics, we conclude that extra dots are formed inside the thermally grown gate oxide which surrounds the lithographically defined dot.

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L. P. Rokhinson, L. J. Guo, S. Y. Chou, D. C. Tsui. 2000-02-06. Double-dot charge transport in Si single electron/hole transistors. https://doi.org/10.1063/1.126105

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