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Bulk Band Gaps in Divalent Hexaborides: A Soft X-Ray Emission Study

J. D. Denlinger·G. -H. Gweon·J. W. Allen·A. D. Bianchi·Z. Fisk
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Abstract

Boron K-edge soft x-ray emission and absorption are used to address the fundamental question of whether divalent hexaborides are intrinsic semimetals or defect-doped bandgap insulators. These bulk sensitive measurements, complementary and consistent with surface-sensitive angle-resolved photoemission experiments, confirm the existence of a bulk band gap and the location of the chemical potential at the bottom of the conduction band.

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J. D. Denlinger, G. -H. Gweon, J. W. Allen, A. D. Bianchi, Z. Fisk. 2001-07-20. Bulk Band Gaps in Divalent Hexaborides: A Soft X-Ray Emission Study. https://doi.org/10.1142/s0218625x0200372x

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