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Electron Correlation Effects in Resonant Inelastic X-ray Scattering of NaV2O5

G. P. Zhang·T. A. Callcott·G. T. Woods·L. Lin·Brian Sales·D. Mandrus·J. He
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Abstract

Element- and site-specific resonant inelastic x-ray scattering spectroscopy (RIXS) is employed to investigate electron correlation effects in {$\rm NaV_2O_5$}. In contrast to single photon techniques, RIXS at the vanadium $L_3$ edge is able to probe $d-d^*$ transitions between V d-bands. A sharp energy loss feature is observed at -1.56 eV, which is well reproduced by a model calculation including correlation effects. The calculation identifies the loss feature as excitation between the lower and upper Hubbard bands and permits an accurate determination of the Hubbard interaction term $U= 3.0 \pm 0.2$ eV.

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G. P. Zhang, T. A. Callcott, G. T. Woods, L. Lin, Brian Sales, D. Mandrus, J. He. 2002-01-27. Electron Correlation Effects in Resonant Inelastic X-ray Scattering of NaV2O5. https://doi.org/10.1103/physrevlett.88.077401

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