arXiv · cond-mat/0207137
The depinning transition of a driven interface in the random-field Ising model around the upper critical dimension
Abstract
We investigate the depinning transition for driven interfaces in the random-field Ising model for various dimensions. We consider the order parameter as a function of the control parameter (driving field) and examine the effect of thermal fluctuations. Although thermal fluctuations drive the system away from criticality the order parameter obeys a certain scaling law for sufficiently low temperatures and the corresponding exponents are determined. Our results suggest that the so-called upper critical dimension of the depinning transition is five and that the systems belongs to the universality class of the quenched Edward-Wilkinson equation.
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L. Roters, S. Lubeck, K. D. Usadel. 2002-07-04. The depinning transition of a driven interface in the random-field Ising model around the upper critical dimension. https://doi.org/10.1103/physreve.66.026127
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