Magnetic Penetration Depth Measurements of Pr$_{2-x}$Ce$_x$CuO$_{4-δ}$ Films on Buffered Substrates: Evidence for a Nodeless Gap

Abstract

We report measurements of the inverse squared magnetic penetration depth, $λ^{-2}(T)$, in Pr$_{2-x}$Ce$_{x}$CuO$_{4-δ}$ ($0.115 \leq x \leq 0.152$) superconducting films grown on SrTiO$_3$ (001) substrates coated with a buffer layer of insulating Pr$_{2}$CuO$_{4}$. $λ^{-2}(0)$, $T_c$ and normal-state resistivities of these films indicate that they are clean and homogeneous. Over a wide range of Ce doping, $0.124\leq x \leq 0.144$, $λ^{-2}(T)$ at low $T$ is flat: it changes by less than 0.15% over a factor of 3 change in $T$, indicating a gap in the superconducting density of states. Fits to the first 5% decrease in $λ^{-2}(T)$ produce values of the minimum superconducting gap in the range of $0.29\leqΔ_{\rm min}/k_BT_c\leq1.01$.