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Zero-bias anomalies in electrochemically fabricated nanojunctions

L. H. Yu·D. Natelson
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Abstract

A streamlined technique for the electrochemical fabrication of metal nanojunctions (MNJs) between lithographically defined electrodes is presented. The first low-temperature transport measurements in such structures reveal suppression of the conductance near zero-bias. The size of the zero-bias anomaly (ZBA) depends strongly on the fabrication electrochemistry and the dimensions of the resulting MNJ. We present evidence that the nonperturbative ZBA in atomic-scale junctions is due to a density of states suppression in the leads.

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L. H. Yu, D. Natelson. 2003-07-22. Zero-bias anomalies in electrochemically fabricated nanojunctions. https://doi.org/10.1063/1.1565678

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