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Kelvin Probe Spectroscopy of a Two-Dimensional Electron Gas Below 300 mK

T. Vancura·S. Kicin·T. Ihn·K. Ensslin·M. Bichler·W. Wegscheider
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Abstract

A scanning force microscope with a base temperature below 300 mK is used for measuring the local electron density of a two-dimensional electron gas embedded in an Ga[Al]As heterostructure. At different separations between AFM tip and sample, a dc-voltage is applied between the tip and the electron gas while simultaneously recording the frequency shift of the oscillating tip. Using a plate capacitor model the local electron density can be extracted from the data. The result coincides within 10% with the data obtained from transport measurements.

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T. Vancura, S. Kicin, T. Ihn, K. Ensslin, M. Bichler, W. Wegscheider. 2003-08-05. Kelvin Probe Spectroscopy of a Two-Dimensional Electron Gas Below 300 mK. https://doi.org/10.1063/1.1614836

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