Modeling electric field sensitive scanning probe measurements for a tip of arbitrary shape

I. Kuljanishvili; Subhasish Chakraborty; I . J. Maasilta; S. H. Tessmer; M. R. Melloch

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Modeling electric field sensitive scanning probe measurements for a tip of arbitrary shape

I. Kuljanishvili·Subhasish Chakraborty·I . J. Maasilta·S. H. Tessmer·M. R. Melloch

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Abstract

We present a numerical method to model electric field sensitive scanning probe microscopy measurements which allows for a tip of arbtrary shape and invokes image charges to exactly account for a sample dielectric overlayer. The method is applied to calculate the spatial resolution of a subsurface charge accumulation imaging system, achieving reasonable agreement with experiment.

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I. Kuljanishvili, Subhasish Chakraborty, I . J. Maasilta, S. H. Tessmer, M. R. Melloch. 2004-11-22. Modeling electric field sensitive scanning probe measurements for a tip of arbitrary shape. https://arxiv.org/abs/cond-mat/0309667

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