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Scaling of the Coercive Field with Thickness in Thin-Film Ferroelectrics

P. Chandra·M. Dawber·P. B. Littlewood·J. F. Scott
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Abstract

Motivated by the observed thickness-scaling of the coercive field in ferroelectric films over five decades, we develop a statistical approach towards understanding the conceptual underpinnings of this behavior. Here the scaling exponent is determined by the field-dependence of a known and measured quantity, the nucleation rate per unit area. We end with a discussion of our initial assumptions and point to instances where they could no longer be applicable.

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P. Chandra, M. Dawber, P. B. Littlewood, J. F. Scott. 2003-10-03. Scaling of the Coercive Field with Thickness in Thin-Film Ferroelectrics. https://arxiv.org/abs/cond-mat/0310074

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