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Quantitative analysis of the critical current due to vortex pinning by surface corrugation

Alain Pautrat·J. Scola·C. Goupil·Ch. Simon·C. Villard·B. Domenges·Y. Simon·Ch. Guilpin·L. Mechin
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Abstract

The transport critical current of a Niobium (Nb) thick film has been measured for a large range of magnetic field. Its value and variation are quantitatively described in the framework of the pinning of vortices due to boundary conditions at the rough surface, with a contact angle well explained by the spectral analysis of the surface roughness. Increasing the surface roughness using a Focused Ion Beam results also in an increase of the superficial critical current.

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Alain Pautrat, J. Scola, C. Goupil, Ch. Simon, C. Villard, B. Domenges, Y. Simon, Ch. Guilpin, L. Mechin. 2004-04-14. Quantitative analysis of the critical current due to vortex pinning by surface corrugation. https://doi.org/10.1103/physrevb.69.224504

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