Raman microspectroscopic characterization of amorphous silica plastic behavior

Antoine Perriot; Valérie Martinez; Laurent Grosvalet; Christine Martinet; Bernard Champagnon; Damien Vandembroucq; Etienne Barthel

arXiv · cond-mat/0409726

Raman microspectroscopic characterization of amorphous silica plastic behavior

Antoine Perriot·Valérie Martinez·Laurent Grosvalet·Christine Martinet·Bernard Champagnon·Damien Vandembroucq·Etienne Barthel

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Abstract

Raman microspectroscopy was used to characterize amorphous silica plastic behavior. Using a correlation between Raman spectrum and density, a map of the local residual indentation-induced densification is obtained. The existence of a densification-induced hardening is also evidenced through a diamond anvil cell experiment. Such observations are not accounted for by the previously proposed hardening-free pressure-dependent yield criterion based on indentation curves. These results open the way to more accurate description of a constitutive law for amorphous silica.

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Antoine Perriot, Valérie Martinez, Laurent Grosvalet, Christine Martinet, Bernard Champagnon, Damien Vandembroucq, Etienne Barthel. 2006-02-03. Raman microspectroscopic characterization of amorphous silica plastic behavior. https://arxiv.org/abs/cond-mat/0409726

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