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Electric field induced charge injection or exhaustion in organic thin film transistor

Manabu Kiguchi·Manabu Nakayama·Toshihiro Shimada·Koichiro Saiki
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Abstract

The conductivity of organic semiconductors is measured {\it in-situ} and continuously with a bottom contact configuration, as a function of film thickness at various gate voltages. The depletion layer thickness can be directly determined as a shift of the threshold thickness at which electric current began to flow. The {\it in-situ} and continuous measurement can also determine qualitatively the accumulation layer thickness together with the distribution function of injected carriers. The accumulation layer thickness is a few mono layers, and it does not depend on gate voltages, rather depends on the chemical species.

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Manabu Kiguchi, Manabu Nakayama, Toshihiro Shimada, Koichiro Saiki. 2004-11-18. Electric field induced charge injection or exhaustion in organic thin film transistor. https://doi.org/10.1103/physrevb.71.035332

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