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Microstructural and morphological properties of homoepitaxial (001)ZnTe layers investigated by x-ray diffuse scattering

T. Di Luccio·G. Scalia·L. Tapfer·P. Morales·M. Traversa·P. Prete·N. Lovergine
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Abstract

The microstructural and morphological properties of homoepitaxial (001)ZnTe layers are investigated by x-ray diffuse scattering. High resolution reciprocal space maps recorded close to the ZnTe (004) Bragg peak show different diffuse scattering features. One kind of cross-shaped diffuse scattering streaks along <111> directions can be attributed to stacking faults within the epilayers. Another kind of cross-shaped streaks inclined at an angle of about 80deg with respect to the <110> in-plane direction arises from the morphology of the epilayers. (abridged version)

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T. Di Luccio, G. Scalia, L. Tapfer, P. Morales, M. Traversa, P. Prete, N. Lovergine. 2005-04-16. Microstructural and morphological properties of homoepitaxial (001)ZnTe layers investigated by x-ray diffuse scattering. https://doi.org/10.1063/1.1870101

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