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arXiv · cond-mat/0610408

Combined scanning force microscopy and scanning tunneling spectroscopy of an electronic nano-circuit at very low temperature

Julien Senzier·Pengshun S. Luo·Hervé Courtois
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Abstract

We demonstrate the combination of scanning force microscopy and scanning tunneling spectroscopy in a local probe microscope operating at very low temperature (60 mK). This local probe uses a quartz tuning fork ensuring high tunnel junction stability. We performed the spatially-resolved spectroscopic study of a superconducting nano-circuit patterned on an insulating substrate. Significant deviations from the BCS prediction are observed.

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Julien Senzier, Pengshun S. Luo, Hervé Courtois. 2007-03-28. Combined scanning force microscopy and scanning tunneling spectroscopy of an electronic nano-circuit at very low temperature. https://doi.org/10.1063/1.2436651

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