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AMR and magnetometry studies of ultra thin GaMnAs films

A. W. Rushforth·A. D. Giddings·K. W. Edmonds·R. P. Campion·C. T. Foxon·B. L. Gallagher
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Abstract

We have measured the Anisotropic Magnetoresistance (AMR) of ultra thin (5nm) Ga(0.95)Mn(0.05)As films. We find that the sign of the AMR can be positive or negative, which may depend on the direction of the current with respect to the crystal. At low temperatures, transport measurements and SQUID magnetometry suggest that the magnetisation has a component pointing out of the plane of the film.

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A. W. Rushforth, A. D. Giddings, K. W. Edmonds, R. P. Campion, C. T. Foxon, B. L. Gallagher. 2006-10-25. AMR and magnetometry studies of ultra thin GaMnAs films. https://doi.org/10.1002/pssc.200672836

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