arXiv · cond-mat/0702324
Analytical formula and measurement technique for the built-in potential of practical diffused semiconductor junctions
Abstract
Based on the Gauss law for the electric field, a new integral formula is deduced together with one of its possible applications, in the area of semiconductor junctions, specifically an analytical formula for the built-in potential of diffused semiconductor junctions. The measurement technique for the determination of the built-in voltage is also described.
Explore related subjects
Keep this discovery
Explore connections, maps & timelines
Miron J. Cristea. 2007-02-28. Analytical formula and measurement technique for the built-in potential of practical diffused semiconductor junctions. https://arxiv.org/abs/cond-mat/0702324
Cite the original work for its findings. Save a collection to share your selection of sources.