arXiv · cond-mat/9303015
Delocalization of Flux Lines from Extended Defects by Bulk Randomness
Abstract
We study the delocalization by bulk randomness of a single flux line (FL) from an extended defect, such as a columnar pin or twin plane. In three dimensions, the FL is always bound to a planar defect, while there is an unpinning transition from a columnar pin. Transfer matrix simulations confirm this picture, and indicate that the divergence of the localization length from the columnar defect is governed by a liberation exponent $ν_\perp =1.3 \pm 0.6$, for which a ``mean-field'' estimate gives $ν_\perp \approx 0.78$. The results, and their extensions, are compared to other theories. The effects may be observable in thin samples close to $H_{c1}$.
Explore related subjects
Keep this discovery
Explore connections, maps & timelines
Leon Balents, Mehran Kardar. 1993-03-09. Delocalization of Flux Lines from Extended Defects by Bulk Randomness. https://doi.org/10.1209/0295-5075%2F23%2F7%2F007
Cite the original work for its findings. Save a collection to share your selection of sources.