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arXiv · cond-mat/9811158

Superconducting Material Diagnostics using a Scanning Near-Field Microwave Microscope

Steven M. Anlage·D. E. Steinhauer·C. P. Vlahacos·B. J. Feenstra·A. S. Thanawalla·Wensheng Hu·Sudeep K. Dutta·F. C. Wellstood
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Abstract

We have developed scanning near-field microwave microscopes which can image electrodynamic properties of superconducting materials on length scales down to about 2 $μ$m. The microscopes are capable of quantitative imaging of sheet resistance of thin films, and surface topography. We demonstrate the utility of the microscopes through images of the sheet resistance of a YBa2Cu3O7-d thin film wafer, images of bulk Nb surfaces, and spatially resolved measurements of Tc of a YBa2Cu3O7-d thin film. We also discuss some of the limitations of the microscope and conclude with a summary of its present capabilities.

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Steven M. Anlage, D. E. Steinhauer, C. P. Vlahacos, B. J. Feenstra, A. S. Thanawalla, Wensheng Hu, Sudeep K. Dutta, F. C. Wellstood. 1998-11-11. Superconducting Material Diagnostics using a Scanning Near-Field Microwave Microscope. https://doi.org/10.1109/77.783934

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