arXiv · cond-mat/9812421
On the reorientation transition of ultra-thin Ni/Cu(001) films
Abstract
The reorientation transition of the magnetization of ferromagnetic films is studied on a microscopic basis within a Heisenberg spin model. Using a modified mean field formulation it is possible to calculate properties of magnetic thin films with non-integer thicknesses. This is especially important for the reorientation transition in Ni/Cu(001), as there the magnetic properties are a sensitive function of the film thickness. Detailed phase diagrams in the thickness-temperature plane are calculated using experimental parameters and are compared with experimental measurements by Baberschke and Farle (J. Appl. Phys. 81, 5038 (1997)).
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A. Hucht, K. D. Usadel. 1998-12-30. On the reorientation transition of ultra-thin Ni/Cu(001) films. https://doi.org/10.1016/s0304-8853(98)01200-1
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