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Electronic-Transport Properties of Al-Cu-Fe Thin Films

R. Haberkern·C. Roth·R. Knoefler·F. Zavaliche·P. Haeussler
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Abstract

Amorphous samples of Al-Cu-Fe were crystallized to the icosahedral phase under the control of electrical conductivity and thermopower at a rather small temperature of T=720 K. A comparison between different annealing states of the amorphous and the resulting quasicrystalline phase done on the same sample shows aston-ishing parallels in conductivity and large differences in thermopower.

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R. Haberkern, C. Roth, R. Knoefler, F. Zavaliche, P. Haeussler. 1999-11-23. Electronic-Transport Properties of Al-Cu-Fe Thin Films. https://arxiv.org/abs/cond-mat/9911371

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