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Noninvasive measurement of micron electron beam size of high energy using diffraction radiation

G. Naumenko
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Abstract

Treatments of the usage of optical diffraction radiation from the relativistic electrons moving though a conductive slit for the noninvasive transverse beam size measurement encounter hard limitation of the method sensitivity for the electron energy larger than 1 GeV. We consider in this article a possibility of application in a diffraction radiation technique the artificial phase shift, which can take place when transverse electron position varies. This allows us to realize the nonivasive measurements of transverse size of supper-relativistic electron beams with the small emittance.

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G. Naumenko. 2004-05-31. Noninvasive measurement of micron electron beam size of high energy using diffraction radiation. https://arxiv.org/abs/hep-ex/0305004

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