arXiv · hep-ex/9509008
GaAs Microstrip Testbeam Results
Abstract
A gallium arsenide detector was tested with a beam of 70GeV pions at the {\sf SPS} at CERN. The detector utilises a novel biasing scheme which has been shown to behave as expected. The detector has a pitch of 50$μ$m and therefore an expected resolution of 14.5$μ$m. The measured resolution was approximately 14$μ$m. By using a non-linear charge division algorithm this can be increased to $\approx$ 12$μ$m. Noise was the limiting factor to the resolution. This was 2000e$^-$ as opposed to the expected 360e$^-$. This noise is also thought to have reduced the detection efficiency of the detector. The source of the excess noise is currently being investigated.
Explore related subjects
Keep this discovery
Explore connections, maps & timelines
S. Gowdy. 1995-09-14. GaAs Microstrip Testbeam Results. https://arxiv.org/abs/hep-ex/9509008
Cite the original work for its findings. Save a collection to share your selection of sources.