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ELECTRONIC STRUCTURE OF FeSi

V. R. Galakhov·E. Z. Kurmaev·V. M. Cherkashenko·Yu. M. Yarmoshenko·S. N. Shamin·A. V. Postnikov·St. Uhlenbrock·M. Neumann·Z. W. Lu·Barry M. Klein·Zhu-Pei Shi
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Abstract

The full set of high-energy spectroscopy measurements including X-ray photoelectron valence band spectra and soft X-ray emission valence band spectra of both components of FeSi (Fe K_beta_5, Fe L_alpha, Si K_beta_1,3 and Si L_2,3) are performed and compared with the results of ab-initio band structure calculations using the linearized muffin-tin orbital method and linearized augmented plane wave method.

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V. R. Galakhov, E. Z. Kurmaev, V. M. Cherkashenko, Yu. M. Yarmoshenko, S. N. Shamin, A. V. Postnikov, St. Uhlenbrock, M. Neumann, Z. W. Lu, Barry M. Klein, Zhu-Pei Shi. 1995-05-11. ELECTRONIC STRUCTURE OF FeSi. https://doi.org/10.1088/0953-8984%2F7%2F28%2F010

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