Measurements of RF Cavity Voltages by X-ray Spectrum Measurements

J. P. Duke; A. P. Letchford; D. J. S. Findlay

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Measurements of RF Cavity Voltages by X-ray Spectrum Measurements

J. P. Duke·A. P. Letchford·D. J. S. Findlay

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Abstract

Measurement of the endpoints of X-ray spectra emitted from RF cavities is a useful non-invasive technique for measuring peak voltages within the cavities. The matching of calculated X-ray spectra to measured spectra is described, with emphasis upon the endpoint region.

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J. P. Duke, A. P. Letchford, D. J. S. Findlay. 2000-08-14. Measurements of RF Cavity Voltages by X-ray Spectrum Measurements. https://arxiv.org/abs/physics/0008024

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